doc. no : qw0905- rev. : date : 29 - dec. - 2006 a ldgl65540/s8 data sheet ldgl65540/s8 rectangle type led lamps pb lead-free parts ligitek electronics co.,ltd. property of ligitek only
75% 100%50% -60 50% 0 25%25%100% 75% 60 note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. -30 directivity radiation 30 0 1.0min + - 2.54typ 0.5 typ 25.0min 1/5 -0.10 3.2+0.05 -0.1 4.0 0.2 ldgl65540/s8 package dimensions part no. 2.0+0.05 page ligitek electronics co.,ltd. property of ligitek only 1.0max
luminous intensity @ ma(mcd) viewing angle 2 1/2 (deg) spectral halfwidth nm wave length nm color forward voltage @20ma(v) part no ldgl65540/s8 note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. green diffused emitted ingan/gan green material lens 50532 d typ. max.min. typ. 900 3.54.01500 20 storage temperature electrostatic discharge( * ) operating temperature typical electrical & optical characteristics (ta=25 ) dominant 150 -30 ~ +100 -20 ~ +80 tstg t opr esd v power dissipation forward current peak forward current duty 1/10@10khz reverse current @5v absolute maximum ratings at ta=25 ratings dgl 100 50 120 30 i fp pd ir symbol parameter i f mw a ma ma unit ligitek electronics co.,ltd. property of ligitek only 2/5 page * static electricity or power surge will damage the led. use of a conductive wrist band or anti-electrosatic glove is recommended when handing these led. all devices, equipment and machinery must be properly grounded. part no. ldgl65540/s8 82
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( ) r e l a t i v e i n t e n s i t y @ 2 0 m a wavelength (nm) f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 fig.4 relative intensity vs. temperature ambient temperature( ) r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage f o r w a r d c u r r e n t ( m a ) forward current(ma) fig.2 relative intensity vs. forward current r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0101001000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40-200204060 1.0 1.1 1.2 2.03.04.05.0 80100 0.8 0.9 -20 -40 40 20 080100 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 dgl chip 450 0.0 0.5 1.0 500 550 600 page3/5 part no. ldgl65540/s8
5 /sec max note:1.wave solder should not be made more than one time. 2.you can just only select one of the soldering conditions as above. 60 seconds max 25 0 0 120 2 /sec max preheat 50 100 dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2 c/sec(max) ramp-down:-5 c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to body) 260 temp( c) 260 c3sec max 2.wave soldering profile 150 time(sec) ligitek electronics co.,ltd. property of ligitek only soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350 c max soldering time:3 seconds max(one time only) distance:2mm min(from solder joint to body) page 4/5 part no. ldgl65540/s8
the purpose of this test is the resistance of the device under tropical for hours. solderability test solder resistance test 1.t.sol=230 5 2.dwell time=5 1sec this test intended to see soldering well performed or not. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. 1.t.sol=260 5 2.dwell time= 10 1sec. high temperature high humidity test thermal shock test low temperature storage test 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202:103b jis c 7021: b-11 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 jis c 7021: b-12 ligitek electronics co.,ltd. property of ligitek only reliability test: high temperature storage test operating life test test item this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) test condition description mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 mil-std-883:1008 jis c 7021: b-10 reference standard page5/5 part no. ldgl65540/s8
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